走査型電子顕微鏡（SEM）は、その内の二次電子を利用したものであり、試

走査型電子顕微鏡（SEM）は、その内の二次電子を利用したものであり、試料表面に小さく絞った電子線（電子ビーム）を走査しながら照射し、その照射点から出る二次電子を形像して、主として試料表面の凹凸に由来する構造を観察することができる。電子線の波長は光の十万分の一程度なので、光学顕微鏡よりもさらに微細なところまで解像してみることができる。

ผลลัพธ์ (อังกฤษ) 1:

Scanning electron microscope (SEM) using secondary electrons in that, and can observe the secondary electron irradiation while scanning the specimen surface small electron beam (electron beam), get out the its irradiation point 形像, derived from uneven surfaces as the primary structure. You can 100000-degree optical wavelength of the electron beam, so try resolution far more fine than the optical microscope.

ผลลัพธ์ (อังกฤษ) 2:

Scanning electron microscope (SEM) is one that utilizes secondary electrons of which, on the sample surface small focused electron beam (electron beam) is irradiated while scanning, the secondary electrons emitted from the irradiation point was imagery, it is possible to observe a structure mainly derived from the unevenness of the sample surface. Since the wavelength of the electron beam of one hundred thousandth degree of light, it is possible to try to resolve far more finer than the optical microscope.

ผลลัพธ์ (อังกฤษ) 3:

Scanning electron microscopy (SEM) is the use of secondary electrons, the electron beam is reduced on the surface of the sample is irradiated with electron beam scans the image of the secondary electrons from the irradiation point, it is possible to observe mainly structure due to the uneven surface of the sample. The electron beam of one wavelength of light is about ten million, it is possible to try to resolve a finer than the optical microscope.